After IC design, the device under test shall be subject to preparation before subsequent function tests, reliability tests, or debugging.
The sample preparation techniques play a key role in determining function test accuracy and flaw identification easiness.
Aim at sample preparation, iST provides the following services, including IC decapsulation, IC delayer, cross-section & backside grinding, cross-section polisher.
iST excellent SMT test sample preparation and fast assembly experience will assure good quality in later function tests and reliability tests.
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