Home Service I-V Curve Measurement

I-V Curve Measurement

Verify and measure semiconductor device characteristics (e.g., Diode I-V and MOSFET characteristics curves) with voltages or currents provided by a source measurement unit (SMU).

Pinpoint Leakage Current Point of MIM Capacitor in Five Steps

  • What iST can do for you?

    iST may assist verify and measure parameters and characteristics of semiconductor electronic devices, e.g. capacitance-voltage(C-V), voltage-current (I-V), resistance(R), capacitance(C), inductance(L) and signal waveform, to identify causes of devices failure for later analysis.

The Superiority of iST

1

Easy and fast

2

Diversified equipment optional for different requirements

3

SMU with support of high resolution up to 10 fA

4

Measuring different types of packaging together with probe pad

Case Sharing

  • Example of I-V Curve
I-V Curve
  • Application
  • Equipment Capacity
  • Machine limitations
  • DC and semiconductor components characterization
  • Electrical Failure Analysis (EFA)
  • Assistant in subsequent electrical measurements (Force V measure I / Force I measure V).
  • Keysight B1500A
  • Keithley 4200
  • Keithley 2450
  • HP 4156A

C-V Maximum Voltage: 25V, Maximum Frequency: 5 MHz.
I-V Maximum 4 Channel; Maximum Voltage: 200 V、Maximum I.: 1A; Power:20 W.

Contact Window |  Mr. Lei/Rex | Tel:+886-3-5799909#6760  |  Email:web_EFA@istgroup.com

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