Scanning Acoustic Tomography (SAT), also called Scanning Acoustic Microscope (SAM), is a method for analyzing materials by measuring the reflecting speed and energy of an ultrasonic wave which is transmitted through the material of a certain thickness.
When sound signals are transmitted, using pure water as the medium, and hit the interface of different materials, part of the signals reflects and part penetrates. The machine then collects the signals and forms them into images.
What iST can do for you?
Ultrasonic SAT is designed to detect flaws in IC molding including delamination, cracks, voids and bonding status at different locations.
The Superiority of iST
Case Sharing
C-scan (2D reflective plane detection)
Through-scan detection
RDL delamination of WLCSP packaging
PCB blank board inspection – boardpopcorn effect
CMOS-Dam delamination
Chip Crack
C-scan (2D reflective plane detection)
Through-scan detection
Non-flow underfill delamination of flip chippackaging
C-scan 2D reflective plane detection
(Color Mode)
C-scan 2D reflective plane detection
(Colorless Mode)
Through-scan detection
Different probe heads are used for different samples
- 15 Mhz – DIP , PLCC , TO, QFP
- 35 Mhz – BGA , SOP8 , QFP , SOT223 , TO252
- 50 Mhz – QFN , TQFP, DFN
- 75 Mhz – TSSOP , Flash
- 110 Mhz –Wafer , Flip chip
- 230 Mhz –WLCSP , 3DIC
- UHF – CMOS , WLCSP
SONOSCAN GEN 6
SONIX UHR-2001
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