Transmission Line Pulse (TLP) is employed to measure and verify electrical characteristics of ESD protection devices.
The principle is to apply test pulses to a Device under Test (DUT) in two steps. Step 1: Charge the transmission line in the circuit; Step 2: The transmission line discharges to DUT. This test process begins with low voltage pulses and increments these until the DUT is failed.
What iST can do for you?
In the past, ESD protection devices were only assessed for their functionality with a result of PASS or FAIL, no electrical characteristics were provided for further effective design change. With the methods of pulse, TLP is capable of providing IV curve of the ESD protection circuits, in addition to finding out the flaws of circuit design quickly to reduce the time and cost of development.
Case Sharing
Snapback保護裝置會形成一個低阻抗通道用來排出ESD瞬間放電的能量。
Max. Voltage for Sample IV Curve Measurement: 200 V; Max. Pulse for TLP Device: 2500 V; Max. I: 50A.
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