Ion Beam Cross-section Polishing (CP), is used for revealing sample cross-sections by way of ion beam. Unlike the general CP, CP is capable of eliminating stress effects resulting from the polishing process.
- Applicable to soft materials, such as Copper, Aluminum, Gold, Tin, Polymer (caution shall be taken for melting temperature).
- Applicable to hard materials such as ceramic and glass, etc.
- Applicable to heterogeneous materials consisting of two or more materials, such as the combination of metal, ceramic or polymer materials.
Sample maximum size: 11mm(W) x 10mm(D) x 2mm(T)
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