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Will Copper Really be Replaced by Cobalt? Test and Analysis Over 7nm Process Chip

The key in breaking the bottleneck of the advanced process of 7nm have to respond to the major evolution of metal material, especially the transistor…

How to effectivity verify the creep corrosion failure occurrence on electronics?

The IT equipment was easily affected by corrosive gases, moisture…Therefore, it is very important to verify the robustness against creep corrosion…

Face the Inevitable Test Failure. How to Solve Warpage Problem of Automotive Advanced Packages

With booming IoV, the advanced packaging chip has been adopted overwhelmingly. But subsequent, how to solve Automotive advanced package warpage problem…

Count Warpage Amount Before SMT to Avoid Solder Empty and Early Failure

Warpage suffered by IC component may ramp up when SMT on PCBs due to different CTEs between ICs and PCBs. which, in turn, leads to poor reliability…

New Package New Challenges, Solutions for Two Issues of Automotive Electronics Reliability Testing

The semiconductor packaging tech is being advanced driven by booming self-driving car. Allan Tseng is here to share Automotive Testing to cope with new PKG…

IC Repackage Ease-up Inspection Over Advanced Chip Packaging

To identify failure of the single component which results in defective IC is a tall order. Internal wiring and board circuit connections among SiP, MCM, MCP, and QFP tends to suffer in electric tests by interference of other chips or device components which, in turn, makes test results hard or even impossible clear…