Some product failures are caused by moisture. It infiltrates into product along IC enclosure seals or gaps between pins which conducts metals within IC and results in short circuit or current leak. The Temperature and Humidity test is designed to test resistance of IC enclosures against moisture to assure product reliability.
Why Temperature and Humidity Testing is Crucial
Temperature and Humidity Tests are essential for evaluating the resistance of IC enclosures against moisture, ensuring the reliability and longevity of electronic components. These tests simulate harsh environmental conditions to identify potential failures that could compromise the performance of ICs.
Moisture infiltration into electronic components can lead to short circuits and current leaks, posing significant risks to product reliability. Temperature and Humidity Tests help prevent such failures by assessing the resistance of IC enclosures to moisture under extreme conditions.
Common Test Conditions and Standards
Test Conditions
Temperature and Humidity Tests verify and assess the resistance of packaging substances and internal circuits of non-sealed electronic components against moisture corrosion under accelerating factors of high temperature, humidity, and pressure. Common test conditions for consumer electronics, defined by JEDEC, include THB, HAST, uHAST, and PCT.
| Test Item | Temperature | Humidity | Vapor Pressure | Bias | Test Duration |
|---|---|---|---|---|---|
| HAST | 130±2 ℃ | 85±5% | 33.3psia | V cc max | 96(-0,+2)Hrs |
| 110±2 ℃ | 85±5% | 17.7psia | V cc max | 264(-0,+2)Hrs. | |
| THB | 85±2 ℃ | 85±5% | 7.12psia | V cc max | 1000(-24,+168)Hrs. |
| uHAST | 130±2 ℃ | 85±5% | 33.3psia | NA | 96(-0,+2)Hrs. |
| 110±2 ℃ | 85±5% | 17.7psia | NA | 264(-0,+2)Hrs. | |
| PCT | 121±2 ℃ | 100% | 29.7 psia | NA | 96(-0, +5) Hrs duration is typical for this test. |
- Note: You may execute either HAST or THB, as the former is an accelerated version of the latter. uHAST assessment is not needed after the execution of HAST or THB, according to JESD47.
Standards and Specifications
The standards and specifications provide guidelines for conducting these tests, ensuring consistency and reliability in results. Relevant standards include:
- JESD 47/JESD 22-A101/JESD 22-A110/JESD 22-A118/JESD 22-A102
- IEC 60068-2-66
- AEC-Q100/AEC-Q101/AEC-Q102
These standards ensure that the testing process adheres to industry best practices, delivering reliable and consistent results.
Failure Models in Temperature and Humidity Tests
Temperature and Humidity Tests place the Device Under Test (DUT) in an environment of high temperature, humidity, and pressure, then apply voltage to infiltrate moisture into the product. This helps identify several types of failures, including:
- Interface Connectivity: Issues with the connectivity between different materials.
- Change of Metal Compound: Alterations in the metal compound between wire bonding material and wafer or aluminum pad.
- Ion Migration: Electrolytic corrosion leads to short circuits. Ion migration releases tree-shaped metal structures that interconnect metals in different areas.
These failure models highlight areas for improvement in IC design and packaging.
iST's Expertise in Temperature Humidity Testing
iST offers comprehensive Temperature and Humidity Testing services, including professional PCB preparation and adherence to international standards. Our team ensures accurate and reliable results to enhance product reliability. We specialize in:
- Professional PCB preparation for HAST/THB test boards.
- Conducting tests according to industry standards such as JESD, IEC, and AEC-Q.
- Providing testing services for various sectors, including automotive, commercial, industrial, and consumer electronics.
Ion migration releases tree shaped metal which result in interconnection of metals in different area
The Superiority of iST
- Professional PCB preparation team capability of making HAST/THB test boards
Reference specification
- JESD 47/JESD 22-A101/JESD 22-A110/
JESD 22-A118/JESD 22-A102 - IEC 60068-2-66
- AEC-Q100/AEC-Q101/AEC-Q102
- Type：Reach-in chamber
- Applicability：HAST/uHAST/PCT
- Brand：Espec/Kson
- Type：Temperature (and humidity) chamber
- Applicability：THB/THT
- Brand：Espec/Kson
- Automotive/commercial/industrial/consumer electronics