Various temperature environment conditions may expose product vulnerability in its life cycle and lead to product damage or failure which, in turn, may hamper product reliability.
Normal Failure mode
- Solder cracks due to big difference in material expansion coefficient
- Resistance value errors
The Superiority of iST
- Large capacity of thermal cycling chambers in Asia
- Provide customers up to 20,000 channels for online monitoring
Reference Specification
- JESD 22-A104
- IPC 9701
Temperature cyclic Chamber
- Consumer IC/automotive board level