The Superiority of iST
Case Sharing
- Micro structure analysis (lattice image).
- Crystalline defect analysis.
- Element ingredient analysis.
- Thin film stress analysis.
- Electron diffraction analysis.
- Impurity and pollutant analysis.
- Auto Metrology Analysis.
- Semiconductor industry
- LED industry
- Optoelectronics industry
- MEMS industry

FEI Talos-F200
Image | TEM resolution: 0.1nm STEM resolution: 0.16nm |
EDS | Detector: SDD 30 mm2 x 4 Solid angle: 0.95 |
Other functions | Piezo stage + DCFI 4K x 4K CCD |

JEOL JEM-2800F
Image | TEM resolution: 0.1nm STEM resolution: 0.2nm |
EDS | Detector: SDD 100 mm2 x 2 Solid angle: 1.7 |
Other functions | Strain mapping 4K x 4K CCD |

JEOL JEM-2100F
Image | TEM resolution: 0.1nm STEM resolution: 0.2nm |

JEOL JEM-F200
Image | TEM resolution: 0.1nm STEM resolution: 0.16nm |
EDS | Detector: SDD 100 mm2 x 2 Solid angle: 1.7 |
Other functions | Strain mapping 4K x 4K CCD |
Contact Window | Mr. Wang/Jay | Tel:+886-3-5799909#6161 | Email:web_ma@istgroup.com