Traces of dislocations analysis by TEM is a critical Material analysis. Since the dislocations may cause defects leading to leakage currents in IC…
GaN dislocation is a concern in wide band-gap semiconductors, these defects varying in density and types, significantly impact the function…
This article presents the use of FFT (Fourier filtering techniques) to enhance HRTEM image quality in TEM at a relatively lower cost…
TEM DF, the useful feature of TEM. How to select at least 8 types of TEM image analysis techniques to achieve efficient & effective material analysis?
Although it is the same TEM black and white image,there can be drastically different interpretations. What knowledge lies between the black and white of TEM images, and how to ensure that you are on the correct side?
Inertia thinking may enable you to become more proficient, but it may also lead us to a wrong direction in TEM sample preparation…