Operating Life Test (OLT)

• BI (Burn-in) / ELFR (Early Life Failure Rate) : For assessing failure rate in the Early Failure section, or for reducing Early Life Failure Rate via the Burn-in approach. The rate is indicated by DPPM (Defect Parts Per-Million)
• HTOL(High Temperature Operating Life) : For assessing the span of operating life, indicated by FIT or MTTF.

There are also test methods and test conditions corresponding to different product categories, such as HTGB (High Temperature Gate Bias) / HTRG (High Temperature Reverse Bias) / BLT (Bias Life Test).

All the above test conditions require a power supply or signal source to activate the device into working condition or stability. Cycling alteration of Acceleration Factors (voltage and/or temperature) is imposed to the sample for aging effects, the test results are used for calculating the failure rate, FIT (Failure In Time) and MTTF (Mean Time To Failure).