Electron Energy Loss Spectroscopy (EELS) is an alternative compositional analysis technique for TEM, besides Energy Dispersive X-ray Spectroscopy (EDS). Through the interaction of high-energy electrons with the sample, EELS offers an energy resolution better than 1 eV, high sensitivity for low atomic number elements, and information of chemical and crystallographic .
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EFTEM uses an energy filter to select electrons with specific energy losses for imaging, highlighting compositional variations in different layers of a material. This technique can be performed in both the low loss region and the core loss region, depending on what kind of material information required and material systems analyzed.
- Semiconductor Industry
- LED Industry
- Optoelectronics Industry
- Micro-Electro-Mechanical Systems (MEMS) Industry
- Energy Materials Industry
- Semiconductors: IC Manufacturing Process, Advanced Packageing
- Lithium batteries
- Metals & Alloys: copper, iron, aluminum, nickel metals, High-entropy Alloy, etc.
- Ceramics: ITO, alumina (Al₂O₃), zirconia (ZrO₂), SiC, WC, etc.
- Thin Films: crystalline coatings
Gatan GIF Model 1065 Continuum ER

Spectral rate, max. (sps) | 8000 |
Sensor size (pixel x pixel) | 2048 x 2048 |
Energy resolution | <1.0 eV |
Energy range (eV) | 3000 |
Contact Window | Mr. Chen/Darry | Tel:+886-3-5799909#6169 | Email:tem_tw@istgroup.com