What is a Burn-in Board, and at which stage of the manufacturing process is it applied?
The Burn-in Board (BIB) is a critical fixture used in Burn-in testing, primarily designed to evaluate semiconductor devices under accelerated aging conditions such as high temperature and high voltage. This process enables early failure detection and lifetime screening. By identifying potential infant mortality issues before shipment, Burn-in testing significantly enhances product reliability and stability.
Especially suited for applications demanding high long-term stability, such as automotive electronics, industrial control systems, AI accelerators, and server platforms.
iST’s Competitive Edge in Burn-in Board Design
- Burn-in testing for automotive chips
- Reliability and lifetime verification for AI accelerators
- High-temperature lifetime testing for server and communication components
- Early failure screening for industrial ASICs
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