What is a Burn-in Board, and at which stage of the manufacturing process is it applied?
A probe card is a critical interface tool used during the wafer test (Wafer Sort Test /Chip Probing) stage of semiconductor production. Before the ICs are diced and packaged, precise electrical testing is performed to ensure they meet mass production quality. By using a probe card, each die on the wafer can be accurately connected to the automated test equipment (ATE) for electrical verification. This process effectively screens out defective chips early, stabilizes and streamlines the testing workflow, and ultimately improves packaging efficiency and overall production yield.
This article will introduce the functions, types, applications, and advantages of Burn-in Boards.
iST’s Competitive Edge in Burn-in Board Design
- Burn-in testing for automotive chips
- Reliability and lifetime verification for AI accelerators
- High-temperature lifetime testing for server and communication components
- Early failure screening for industrial ASICs
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