TEM EDS Calibration simplifies the analysis process with the standardless quantitative method; however, light elements often cause errors…
A14 process is set to launch, with high-resolution electron microscopy reaching its limits, what exactly is APT? How its samples prepared?
TEM EDS light elements like carbon, nitrogen, and oxygen, does TEM/EDS compositional analysis become inaccurate? It turns out that…
As the semiconductor manufacturing process approaches its limits, materials analysis has become crucial for overcoming bottlenecks. In the industry, electron microscopes coupled with X-ray…
Traces of dislocations analysis by TEM is a critical Material analysis. Since the dislocations may cause defects leading to leakage currents in IC…
GaN dislocation is a concern in wide band-gap semiconductors, these defects varying in density and types, significantly impact the function…
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