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Breaking A14 Node Barriers! How APT Transforms Materials Analysis
2025-01-07

A14 process is set to launch, with high-resolution electron microscopy reaching its limits, what exactly is APT? How its samples prepared?

TEM EDS Analysis Inaccuracy Caused by Light Element Absorption
2024-07-16

TEM EDS light elements like carbon, nitrogen, and oxygen, does TEM/EDS compositional analysis become inaccurate? It turns out that…

Intelligent Interpretation of True or False Signals in EM/EDS Analysis
2024-06-25

As the semiconductor manufacturing process approaches its limits, materials analysis has become crucial for overcoming bottlenecks. In the industry, electron microscopes coupled with X-ray…

Decode Semiconductor Dislocation Traces Unveil Chip Leakage Causes with TEM
2024-04-16

Traces of dislocations analysis by TEM is a critical Material analysis. Since the dislocations may cause defects leading to leakage currents in IC…

Decoding GaN Epitaxial Layer Dislocation Types with TEM Analysis
2024-02-22

GaN dislocation is a concern in wide band-gap semiconductors, these defects varying in density and types, significantly impact the function…

Lower-Cost TEM Unlocks Atomic-Scale Heterogeneous Crystal Interfaces
2023-09-21

This article presents the use of FFT (Fourier filtering techniques) to enhance HRTEM image quality in TEM at a relatively lower cost…

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