Tech Library Archives - 頁4，共13 - iST-Integrated Service Technology

2023-12-05by ruby

iST's Exclusive Technique Efficiently Detects Hot Spots in GaN Chips

2023-10-26by ruby

The Key to Achieve Net Zero Greenhouse Gas Emissions and Enhance the ESG Report

Thin film adhesion hardness

2023-10-17by ruby

Four Key Applications of Nanoindentation and Scratch Testing for Advanced Packaging

TEM EDS Calibration Although the standardless quantitative method simplifies the analysis process, light elements often lead to errors due to absorption effects. This article introduces a self-calibration technique that significantly improves the accuracy of analyzing oxides, nitrides, and similar materials by correcting EDS data through reference phases. The effectiveness of this method is demonstrated using a GaN thin-film case study.

2023-09-21by ruby

Lower-Cost TEM Unlocks Atomic-Scale Heterogeneous Crystal Interfaces

Thermal Analysis When we measure material characteristics through thermal analysis or reference material specifications provided by manufacturers, can we be certain that these values are absolutely accurate?

2023-09-12by ruby

Decoding Thermal Characteristics in Advanced Packaging Materials

ClearMR

2023-08-08by ruby

VESA Introduces ClearMR Certification to Redefine Gaming Monitor Motion Display Specifications

TEM EDS Calibration Although the standardless quantitative method simplifies the analysis process, light elements often lead to errors due to absorption effects. This article introduces a self-calibration technique that significantly improves the accuracy of analyzing oxides, nitrides, and similar materials by correcting EDS data through reference phases. The effectiveness of this method is demonstrated using a GaN thin-film case study.

2023-07-27by ruby

Five Case Studies Unveil What You Don’t Know About TEM Material Analysis

Eg measurement

2023-07-11by ruby

How to Choose the Next Generation of Wide Bandgap Semiconductor Materials Beyond GaN and SiC

USB Type-C

2023-06-13by ruby

Overcoming Compatibility Challenges in USB Type-C Display Dual Functionality

TEM EDS Calibration Although the standardless quantitative method simplifies the analysis process, light elements often lead to errors due to absorption effects. This article introduces a self-calibration technique that significantly improves the accuracy of analyzing oxides, nitrides, and similar materials by correcting EDS data through reference phases. The effectiveness of this method is demonstrated using a GaN thin-film case study.

2023-05-23by ruby

How to Interpret the Brightness and Darkness of TEM Images to Unlock the Secrets of Materials