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PCB design:Key to pass or fail in board level reliability tests
2022-05-03

Do you know that PCB design is the key to pass or fail in broad level reliability tests?

How to interpret MTTF?
2022-04-26

How to interpret and use the values from HTOL and the resulting MTTF and Failure Rate (λ)? What are the differences between MTTF and MTBF?

How to find the SiP/ MCM Defects
2022-04-11

How to find suspected defects from complicated MCP/SiP structure? How to isolate interference from other chips/dies and get correct testing results?

Improved delayering techniques for better fault isolation efficiency of advanced process chip
2022-03-24

As an extension of grinding delayer, PFIB can perform large area and excellent uniformity delayering of a specific area or layer through plasma etching with the manufacturer’s patented gas to fully present the target area of up to 200μm x 200μm …

Why Do Two ESD Tests End up Having Such Different Results?
2022-02-15

Have you ever wondered why your product ended up with contradicting result after ESD test by different labs? Or, shocked when two latch-up tests on the same product failed and passed respectively….

How to Transform Existing Chips into Final Test Sockets
2022-01-05

How to package a small amount of chips for testing yet no assembling and testing houses would offer their help? See this article for quick FT Socket…