In an advanced process, while stringent control to verify quality stability is required after materials selection and changes, how to verify the characteristics of new materials?
How to use analysis tools to verify the rheological characterization of materials underfill in heterogeneous component integration, as well as the strength of bonding strength of copper and dielectric materials…
Which surface analysis tool should be chosen to catch process defects? How to use surface analysis tools to catch defects in the semiconductor process?