Surface roughness is critical to the adhesiveness of coating and varies with the product and process.Measuring roughness plays a key role in process…
With increasing demand in the market, GaN based III-V materials are fabricated into high brightness light emitting diode (LED) and laser diodes (LDs) [1]…
SEM liquid platform is a closed structure which can enclose liquid/volatile materials with the SiN film of several tens of nano thick on the surface of a SEM platform…
Always end up with improper analysis methods and instruments when identifying IC defects? How to select the right surface analysis tools (XPS…
Do you really have to break a 12″ wafer to measure its surface roughness? iST employs a Bruker Dimension ICON AFM…
Plasma FIB enables large scope observation to present the whole structure in the target area at etching speeds 20 folds faster than traditional DB FIB…