Reliability Design Test Archives - iST-Integrated Service Technology

X-ray TID Don’t Let X-ray Inspection Become a Silent Killer of IC Reliability! Unraveling the Risks of Parasitic Radiation

2025-05-06by ruby

Don’t Let X-ray Inspection Become a Silent Killer of IC Reliability! Unraveling the Risks of Parasitic Radiation

Automotive Power Devices With the rapid advancement of electric vehicle, 800V power systems are becoming mainstream, and some major manufacturers have even introduced 1200V GaN (Gallium Nitride) power chip specifications. As voltage and power levels increase, so do the challenges in product reliability. How can we meet the increasingly stringent verification standards? How should we navigate the complex international regulations? Is there a comprehensive verification solution tailored for high-voltage, high-power products?

2025-04-22by Hsinyi

Ensuring Reliability of Automotive Power Devices in the High-Voltage Era

2024-09-09by ruby

Ensuring IC Reliability with Board Level Testing

AEC-Q100 REV A Quick Guide to AEC-Q100 Revision for Automotive Chip Reliability Verification

2024-09-06by ruby

A Quick Guide to AEC-Q100 Revision for Automotive Chip Reliability Verification

SRAM Failure Analysis Investigating the Root Causes of SRAM Failures in AI Applications

2024-06-18by ruby

Solutions to the Challenges of AI Chip Reliability Testing

AEC-Q007 standard for BLR in automotive applications

2024-05-14by ruby

The Latest AEC-Q007 Specification Unveils Advanced Board Level Verification for Automotive Applications

Flying Probe Optimizing PCBA Quality: Flying Probe Testing in the AI and HPC Era

2024-03-19by ruby

Optimizing PCBA Quality: Flying Probe Testing in the AI and HPC Era

2023-03-21by ruby

A Quick Guide to Distinguish Preconditioning Testing and MSL Testing

sulfur corrosion

2022-12-13by ruby

Why does sulfur corrosion failure still occurred on electronics with conformal coating?

2022-07-12by ruby

Preventing Electrochemical Migration in HAST