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Pinpoint Leakage Current Point of MIM Capacitor in Five Steps
2020-02-03

MIM capacitor is widely adopted in screening out noise from RF-IC, serving as load components in digital electronics and general used in IC and PCB…

Determining Whether IC Defects are Caused by the Poor Packaging
2018-03-27

The iST Tech Classroom for this month is about finding ways to pinpoint IC package defects without damaging the sample itself. Step 1: Positioning, detect failure depth…