How to find suspected defects from complicated MCP/SiP structure? How to isolate interference from other chips/dies and get correct testing results?
Have you ever wondered why your product ended up with contradicting result after ESD test by different labs? Or, shocked when two latch-up tests on the same product failed and passed respectively….
What to do when SEM can’t distinguish substances of samples by layers? No defects found with SEM even the defected ICs have been delayered? SEM BSE helps…
MIM capacitor is widely adopted in screening out noise from RF-IC, serving as load components in digital electronics and general used in IC and PCB…
3D X-ray are also ideal for non-destructive inspection over 3D IC, MEMS, and even PCB, PCBA, lithium battery/engineering Plastics…