Tech Library Archives - iST-Integrated Service Technology

IC substrate In the early stages of R&D, engineers frequently face the same challenges: the quantity of IC Engineering Substrate samples is too small, making major manufacturers unwilling to accept the order. Even more troublesome, once the boards are finally secured, engineers still need to find a packaging house for die mount, which is time-consuming and labor-intensive, severely dragging down the verification timeline.

2025-11-11by Hsinyi

Small-volume and Diverse Turnkey IC Substrate Service for R&D Verification

Robber Socket

2025-11-06by Hsinyi

QFN FT Testing Always Getting Stuck? Rubber Socket Lifetime Only 20K Cycles Here’s the Fix

HAST PCB Fail You might assume that the HAST is only verifying the IC, but often, the PCB is the first component to fail. In the AI, HPC, and advanced-packaging era, the PCB is no longer a mere supporting actor. Want to secure your yield? Don't just look at the chip; start with the PCB.

2025-10-21by Hsinyi

HAST Failed? Preventing PCB Micro-Shorts Before You Blame the Chip

Silicon Photonics When it comes to “leakage”, most engineers immediately think of electrical leakage. But in the photonics world, there’s another kind of leakage — light leakage.

2025-10-14by jessica

Why Silicon Photonics Development So Hard？Verification is the Key

TGV Failure Analysis

2025-09-09by Hsinyi

Glass Substrate vs. Silicon Substrate: Unveiling the True Cause of TGV Product Failures

EBSD TGV banner

2025-08-21by Hsinyi

Unveiling the Hidden Threat in the TGV Process: How EBSD Tackles the Stress Issue

Kikuchi Bands EBSD banner

2025-08-19by Hsinyi

How to Understand Crystal Structures? EBSD Reveals the Secrets Inside Materials

3D Surface

2025-07-22by Hsinyi

Yield Problems? Master 3D Surface Topography with 4 Methods

TEM EELS banner

2025-06-12by Hsinyi

EELS: The TEM Tool You Shouldn’t Overlook

Reliability Testing with Real-Time In-situ Monitoring Reliability testing often requires long validation periods. Are you relying solely on external lab data and passively waiting for results? During testing, how can you gain real-time access to product data to shorten decision-making cycles and accelerate development efficiency?

2025-05-20by Hsinyi

How to Tackle AI and EV Reliability? iST’s Global Smart Monitoring Breaks Through Three Key Challenges

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