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FIB Circuit Edit
There are usually defects in the preliminary stage of the IC development. FIB provides IC designers direct and fast microcircuit modification and observation of the IC internal signals via a probe station or E-beam when retrieving the signal among the complex circuits. Saving the cost of the re-do (mask), shortening the time of prototype validation and expediting time to market are the benefits this tool can help to achieve.

Introduction and Application of FIB
FIB Circuit Edit
Backside FIB Circuit Edit
CAD Probe Pad/Debug
The Innovative FIB Circuit Edit
G2 WLCSP circuit edit solution

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