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Material Analysis
 

Material ingredients, characteristics and structures of micro scales predominate substance characteristics in the macro-scale world, therefore material analysis always plays an important role either in initial stages of a newly developed technology or in the domain of failure analyses. A successful material analysis requires a perfect marriage between precision instruments and plentiful know-how. IST laboratories are equipped with comprehensive analytical instruments including high-resolution FE-SEM, TEM, etc. for structural analyses, AES, EDS, etc. for ingredients analyses, TMA for thermal analysis, and Nano-probing for mono transistor electrical measurements. Added with well-experienced staff and knowledgeable professionals with respective expertise (e.g. IC Process / Package/ Lead-free/ IMC/ Tin Whisker, etc.), IST is confident in providing customers with total solutions. IST also possesses advance sampling technologies like micro-etching, ion polishing, etc. to complete and expedite our services.

IST Services include:
   Chemical Structure Identification (FTIR, UV-Vis) 
   Elemental Testing (EDS, EDXRF, ICP-OES) 
   Microscopy (optical, SEM, TEM) 
   Chromatography and Separations (HPLC, IC, GC) 
   Mass Spectrometry (GC-MS) 
   Surface Analysis (SIMS, ESCA) 
   Thermal Analysis (TMA)

Non-organic
Compound
GAAS,FLAAS,ICP-OES,UV-Vis,IC,EDXRF,Auger,SEM/EDS,TEM
Organic
Compound
Headspace-GC-MS,GC-ECD/MS,GC-ECD/MS/MS,GC-FID,GC-ECD,GC-AED,GC-FPD,HPLC-DAD,HPLC-FPD,UV-Vis,μ-FTIR/ATR
 

Structure Observation
Scanning Electron Microscope(SEM)
Transmission Electron Microscopy(TEM)
Dual-beam FIB
Plasma FIB
Surface Analysis
Auger Electron Spectroscopy(AES)
Atomic Force Microscopy (AFM)
Secondary Ion Mass Spectrometry(SIMS)
White light interferometry (WLI)
Thermal Analysis
Thermal Mechanical Analyzer (TMA)

Component Analysis
Secondary Ion Mass Spectrometry(SIMS)
Scanning Electron Microscope (SEM)
Transmission Electron Microscopy(TEM)
Auger Electron Spectroscopy(AES)
XPS/ESCA
  

 
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