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Introduction and Application of FIB
 
 
 
 
 
 
 
 



CAD Probe Pad/Debug
 

FIB is capable of making signal retrieving probe gads in an IC. Using FIB, points where signals must be measured are led to the surface of the IC so that a Mechanical prober may retrieve internal signals in IC.

When measuring IC signals with a Mechanical prober, the IC is placed on a test board for necessary voltage conditions. In general, signals inside the IC are weak and they are insufficient to drive the combined load of lead wires and oscillator, resulting in issues such as square waves deformed into triangular waves and reduced DC levels. These problems can be improved by way of Active Probing.

CAD Probe Pads / Debug 
 
 
 
pad、fib pad、probing pad
王先生/Chino
+886-3-5799909#6000
web_fib@istgroup.com
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Other services you may be interested in:
 
FIB Circuit Edit
Backside FIB Circuit Edit
The Innovative FIB Circuit Edit
Auto Curve Tracer
Prober (Prober Station)
HP4156 Parameter Analyzer
 


 
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