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Non-destructive Analysis
Electrical Characteristics Measurement
Defect Detection
Competitive Analysis

Digital Photos

Through the photography system of optical microscopy (or electron microscopy), the structure texture of the chip surface can be presented in digital photos. The surface of a large area can be shown by an image combining multiple photos (IST has developed proprietary software that enables customers to observe circuits in different layers). The system also provides graphic file output services.

   Electronic circuit layout analysis
   Process cost analysis
   Circuit reverse engineering
   Circuit reverse engineering (to work with proprietary software)

Leica digital photograph system
digital photo、digital、OM
Please contact nearest location for inquiries :
USA Taiwan ─ Hsinchu China ─ Shanghai Kunshan Beijing Shenzhen Japan
Other services you may be interested in:
IC Reverse Engineering
IC Cost Analysis

Lab Service:    Taiwan      |       China      |        USA       |       Japan     |       TWN ITS     |       Partnerships
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