Home Seminar 【10/20 Penang Workshop】Accelerating Semiconductor Validation: From Reliability to Root Cause Analysis

【10/20 Penang Workshop】Accelerating Semiconductor Validation: From Reliability to Root Cause Analysis

性質:免費
會議日期: 2026-10-20 ~ 2026-10-20
報名截止:2026-10-17

Introduction

Amid the reshaping of global semiconductor supply chains and continued industry growth,
Penang is rapidly strengthening its position as a key semiconductor manufacturing and engineering hub.

As more semiconductor products move from development to qualification and production,
engineering teams often face critical roadblocks: delayed test hardware interfaces and sample preparation after wafer out,
gaps in transitioning from component-level qualification to Board-Level Reliability (BLR),
complex FA cases requiring cross-border support—all of which can significantly slow down time-to-market.

With over 30 years of excellence in semiconductor validation and analysis, Integrated Service Technology (iST) is hosting an in-person technical seminar in Penang, bringing Taiwan’s proven semiconductor engineering and validation experience to Malaysia to support faster development and stronger local engineering capabilities.

Senior engineering experts from Taiwan will share proven industry methodologies spanning wafer out, test interface design, reliability qualification from CLR to BLR, and in-depth root cause failure analysis.

The session will also touch on key qualification requirements such as AEC-Q where applicable, helping Penang’s engineering and quality teams strengthen end-to-end validation capabilities—from chip-level debugging to global compliance—and accelerate development cycles.

Workshop Highlights

• Accelerate the path from wafer out to validation
• Improve test efficiency with the right test interface solutions
• Strengthen reliability from component to board level
• Identify failure mechanisms and root causes faster
• Reduce revalidation and compliance risks

Event Schedule

TimeTopicsSpeakers
09:00-09:30Registration
09:30-09:35Welcome RemarksIntegrated Service Technology Inc.
Sales Director
Kerry Chien
09:35-10:00Accelerating Silicon Validation – Reduce Development Cycle & Time-to-MarketIntegrated Service Technology Sdn. Bhd.
Sales Manager
Alvin khoo
10:00-10:30From CLR to BLR: A Complete Reliability Validation Solution from Component to Board LevelIntegrated Service Technology Inc.
Senior Vice President of Reliability Analysis Engineering
Allan Tseng
10:30-11:30From Wafer Out to Fast ValidationIntegrated Service Technology Inc.
Senior Vice President of Reliability Analysis Engineering
Allan Tseng
11:30-12:00TBDInviting
12:00-13:30Lunch & Networking
13:30-14:30Key of Semiconductor Excellence: Failure Analysis (FA) Introduction and FA Capability in iSTIntegrated Service Technology Inc.
Director of Failure Analysis Engineering
Dr. Sean Shen
14:30-15:00From Design to Market: De-Risking Product Compliance Through Early Testing & CertificationQAV
15:00-15:20Coffee Break
15:20-15:50˙Thermal Solutions
˙Crest Tester
˙Laser Cleaning Machine
Contacthings
15:50-16:20TBDInviting
16:20Networking & Adjournment

Workshop Information

Target : Professionals in IC Design, Foundry, OSAT, R&D, Test, Reliability, FA, and Quality Engineering.
Fee: Free
Time: 2026/10/20 (Tue) 09:00-16:20
Venue: Level 4 Jadeite, Amari SPICE Penang
Address: 8 Jalan Mahsuri Mukim12, Bayan Lepans, Penang
Parking Information: B1-B2, Amari SPICE Penang
Parking fee: RM5 per entry, with no time limit.
Contact:
Ms. Samantha Phoon, Mobile : +60164737418
E-Mail:samantha_phoon@istgroup.com

Organizer

(iST) Integrated Service Technology Inc.

The organizer reserves the right to adjust or change the agenda. The final agenda is subject to the on-site arrangement.

To protect the intellectual property rights and confidential information of the speaker, presentation slides will not be provided for this workshop.

Limited spots are available. All registration applications will be reviewed before your registration is confirmed. Successful applicants will receive a confirmation email.

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