The registration is limited and will be reviewed prior to approval. A confirmation email will be sent once the registration is accepted.
As a professional courtesy, please do not register if you are from companies in direct competition with the sponsors of this event.
Workshop Overview
[Asia Debut | Two-Day Program] Defining the New Frontier of Failure Analysis in the AI Era with NVIDIA, TSMC, Qualcomm and iST
On April 21 and 22, 2026, the EDFAS FA Workshop, the world’s most authoritative forum for electronic component failure analysis, will make its historic debut in Asia.
This two-day immersive technical program bridges forward looking industry trends with real world practice, creating a more comprehensive international platform for FA knowledge exchange.
This year’s forum converges a collective powerhouse of leaders from across the semiconductor value chain, including industry titans NVIDIA, Qualcomm, and TSMC, as well as cutting-edge technology pioneers Enlitech, Quantum Diamonds, NenoVision, SEMICAPS, and JEOL.
Together, we will navigate the “Post-Generative AI Era,” exploring critical technical bottlenecks and strategic breakthroughs in Failure Analysis (FA).
As electronic architectures reach unprecedented complexity and advanced process nodes evolve, traditional analytical methods face transformative challenges.
This workshop focuses on the latest technical trends and emerging applications, empowering attendees with comprehensive analytical frameworks and actionable insights through expert-led knowledge exchange.
Core Agenda Highlights
Hardware Integration × Practical Exchange: Discover iST’s mature sample preparation techniques and innovative testing interfaces. These solutions accelerate fault localization and verification efficiency, demonstrating the practical value of integrating hardware design with failure analysis.
Visionary Leadership: NVIDIA unveils the future of FA in the AI era, while TSMC delivers deep dives into critical Packaging and PFA (Physical Failure Analysis) challenges.
Frontier Technologies: Enlitech explores Silicon Photonics and CPO (Co-Packaged Optics) localization; Quantum Diamonds reveals the potential of Quantum Diamond Microscopy.
The Microscopic Frontier: Discover the latest precision inspection solutions from NenoVision (AFM-in-SEM), SEMICAPS(Optical Fault Localization Roadmap), and JEOL (SEM Voltage Contrast Imaging).
Networking Giant: Gain insights from Qualcomm’s world-leading practical experience in FA .
Through this technical seminar, we will collectively explore how to shorten product diagnostic cycles and master the core techniques for precise fault localization amidst the AI wave.
Furthermore, the second day will extend into on-site practical exchange, featuring a guided tour of the iST FA Laboratory. This session combines theoretical knowledge with live equipment demonstrations to provide a deeper understanding of failure analysis workflows for advanced processes.
4/21_Event Schedule
| Time | Agenda | Affiliation | Presenter |
|---|---|---|---|
| 09:00-09:05 | Welcome Remarks | iST | iST |
| 09:05-09:10 | Intro of ASM/EDFA/ISTFA | ASM/EDFA | Rosalinda Ring Director, Applications and Engineering |
| 09:10-09:50 | Visionary | NVIDIA | Joy Liao Sr. Manager, FA |
| 09:50-10:30 | FA Process Flow | Qualcomm | Szu Huat Goh Director, Engineering, Test and Analytics |
| 10:30-10:45 | AM Break | ||
| 10:45-11:20 | HW Solutions | iST | Allan Tseng Sr. Vice President |
| 11:20-12:00 | PFA | TSMC | Meng-Han Wang Dept Manager, Product FA |
| 12:00-13:00 | Lunch | ||
| 13:00-13:40 | More OFI | SEMICAPS | Julian Pan Chairman and CEO |
| 13:40-14:15 | CPO | Enlitech | Joseph Liao General Manager |
| 14:15-14:45 | Magnetic techniques | Quantum Diamonds | Fleming Bruckmaier CTO |
| 14:45-15:00 | PM Break | ||
| 15:00-15:30 | AFM-in-SEM | NenoVision | Rosalinda Ring Director, Applications and Engineering |
| 15:30-16:00 | SEM Voltage Contrast | JEOL | Shunsuke ASAHINA Manager, OI Acceleration Department |
| 16:00-16:30 | Case Studies | NVIDIA | Joy Liao Sr. Manager, FA |
| 16:30-17:30 | Networking Event | ||
4/22_Event Schedule
| Time | Agenda | Presenter |
|---|---|---|
| 09:10-09:30 | Opening | Sean Shen Director, Failure Analysis Engineering Division |
| 09:30-11:30 | iST Lab Tour | iST FA Lab Managers |
| 09:30-11:30 | Open Discussion | All |
Registration information
Target Educating students, young professionals, managers who would like to know more about FA trends
Date & Location:
- April 21, 2026 (Tuesday) 09:00–17:30 (Registration begins at 8:30 AM.)
The Ballroom A, 10 Floor, 188, Section 2, Zhonghua Road Hsinchu City, Taiwan - April 22, 2026 (Wednesday) 09:00–11:30 (Registration begins at 8:50 AM.)
1F Lobby, iST Headquarters No. 10-1, Lixing 1st Rd., East Dist., Hsinchu Science Park, Hsinchu City
Fee: Free
Registration: Please click “Register Now” on the top of the webpage to register online.
As seats are limited, the organizer reserves the right to review and approve all registrations. Confirmation will be sent via email for approved applicants.
As a professional courtesy, please do not register if you are from companies in direct competition with the sponsors of this event.
Other Information
Slide Presentation Policy: To protect intellectual property and confidential information, presentation slides will not be provided.
Program Adjustments: The organizers reserve the right to modify the schedule, agenda, and other related arrangements in the event of unforeseen circumstances. Your understanding is greatly appreciated.
Organizer
Co-organizer
Sponsors
