iST Launches Global Smart Reliability Center to Accelerate Front-End Validation for AI and EV Applications

Hsinchu, Taiwan – May 9, 2025 – Integrated Service Technology Inc. (iST, TWSE: 3289), a leading provider of electronic product verification and analysis services, today announced the official launch of its Global Smart Reliability Center, developed in response to the growing demand for early-stage reliability testing in AI, high-performance computing (HPC), and electric vehicle (EV) applications.

The new facility integrates “Smart Monitoring with Independent Channels,” “Real-Time Response,” and “Global Connectivity” features, enabling clients to monitor test progress remotely and identify anomalies early, significantly reducing traditional testing cycles that typically span several months. This strategic advancement enhances testing accuracy and R&D efficiency, helping clients gain a critical head start in product development.

According to Roland Tseng, Associate Vice President of iST’s Hardware Solutions Division, the increasing complexity of chip designs driven by AI and EV innovations presents three major pain points in reliability validation: (1) real-time adjustments of testing parameters due to complex chip structures, (2) limitations of conventional testing equipment in addressing diversified requirements, and (3) heavy reliance on manual inspection, which often delays the detection of abnormal conditions.

Tseng further explained that integrating multiple system modules within a chip often leads to challenges such as poor heat dissipation, complex startup procedures, and the need for high-resolution measurements on specific pins. Without a flexible testing system, timely parameter adjustments to meet client needs become difficult, prolonging the early-stage verification process.

Moreover, diverse testing requirements—including voltage and current specifications, Pulse Width Modulation (PWM), Dynamic Feedback Detection (DFD), and Power Expansion (PE)—are increasingly beyond the support scope of standard machines and traditional architectures.

In response to these challenges, iST’s newly launched Global Smart Reliability Center integrates clients’ diverse testing needs by developing software, firmware, and hardware systems with connectivity features. It supports standard machine function expansion and flexible testing methods. Key highlights of this innovative service including three highlights, first, “Secure Remote Access”, clients can log into the system anytime, anywhere with internet access, using account credentials to monitor testing progress in real-time. Second, “Automated Anomaly Detection”, the system immediately detects and automatically powers down in case of anomalies such as excessive temperature or abnormal current during testing, effectively preventing further damage to samples and ensuring accurate subsequent analysis.

In addition, with “Independent Sample Monitoring”, each sample can be independently monitored, providing clear insights into voltage, current, and temperature variations. By utilizing “EDA Tool Integration”, clients can utilize EDA tools to analyze engineering data before mass production, strengthening product development decisions. iST further said.