Verify and measure semiconductor device characteristics (e.g., Diode I-V and MOSFET characteristics curves) with voltages or currents provided by a source measurement unit (SMU).
What iST can do for you?
iST may assist verify and measure parameters and characteristics of semiconductor electronic devices, e.g. measurement or signal waveforms of capacitance-voltage characteristics curves, voltage-current (IV), resistance, capacitance, inductance, to identify causes of devices failure for later analysis.
The Superiority of iST
Case Sharing
- DC and semiconductor components characterization
- Electrical Failure Analysis (EFA)
- Assistant in subsequent electrical measurements (Force V measure I / Force I measure V).
- Keysight B1500A
- Keithley 4200
- Keithley 4250
- HP 4156A
Maximum 4 Channels; Max. voltage: 100 V; Max. I: 100 mA; Max. Power: 2 W
Contact Window | Mr. Chiu/Shaun | Tel:+886-3-5799909#6780 | Email:web_EFA@istgroup.com