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How to analyze crystal structure and film characteristics without damaging the samples?
2018-01-24

Detecting crystal structure stacking shall damage samples under test, is there any non-destructive and easy alternative? The new XRD analysis tool is good..

Best tool-SIMS for calculating P/N dopant concentration
2017-12-26

the indispensable P/N doping concentration profile identify tool-the secondary ion mass spectrum analysis technique-with each wafer/LED process engineer.

Goodbye black & white, SCM easily determines P/N type with colors
2017-01-11

For best P/N identification, it is recommended to obtain its width and depth based on a clear SEM image and identify the position with colors by SCM…